Company Profile

SEC CO., LTD.

Semiconductor solutions in Defect; Particle; Bump; Contamination Detection, Review or Inspection and Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr.

Defect; Particle; Bump; Contamination Detection, Review or Inspection 및 Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr 분야의 반도체 솔루션을 제공합니다.

Equipment

Verified Quality B

Korea (South)

Suwon-si

Trust Snapshot

Verification

Verified

Last verified: 2026-02-14

Quality Grade

Grade B

Sources: 2

Location

Korea (South)

Suwon-si

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Overview

Primary stage: Equipment
Stages: Equipment, Test / Inspection
Country: Korea (South)
City: Suwon-si

What They Do

Defect; Particle; Bump; Contamination Detection, Review or Inspection
Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
Plate Inspection Equipment
Wire Bonding Inspection; Test
X-ray; XRF; 3-D X-Ray; LEXES Systems

Products / Tech

X-eye NF120
X-eye SF160 Series
SNE-ALPHA

Sources

2 sources · expo.semi.org, expo.semi.org

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