Company Profile
RIGAKU CORPORATION
Since its inception in Japan in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology.
Defect; Particle; Bump; Contamination Detection, Review or Inspection 및 Film Thickness; Thickness; Uniformity Measurement; Ellipsometer 분야의 반도체 솔루션을 제공합니다.
Trust Snapshot
Verification
Verified
Last verified: 2026-02-14
Quality Grade
Grade B
Sources: 2
Overview
- Primary stage: Test / Inspection
- Stages: Test / Inspection, Materials
- Country: Japan
- City: TOKYO
What They Do
- Defect; Particle; Bump; Contamination Detection, Review or Inspection
- Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
- Line Width; Critical Dimension (CD) Measurement
- Package Inspection; Lead Scanners
- Stress; Refractive Index; Reflectivity & Conductivity Measurement
- Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
Products / Tech
- XTRAIA MF Series
- XHEMIS TX Series
- ONYX Series
- XTRAIA XD Series
- XRTmicron Series
Tags
Links
Sources
2 sources · expo.semi.org, expo.semi.org
Partner Ecosystem
Companies with overlapping stages or tags.
Request Intro
Use a ready-made draft to introduce your company and request a collaboration call.