Company Profile
Malvern Panalytical
Semiconductor solutions in Stress; Refractive Index; Reflectivity & Conductivity Measurement and Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation.
Stress; Refractive Index; Reflectivity & Conductivity Measurement 및 Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation 분야의 반도체 솔루션을 제공합니다.
Trust Snapshot
Verification
Verified
Last verified: 2026-02-14
Quality Grade
Grade B
Sources: 2
Overview
- Primary stage: Materials
- Stages: Materials, Test / Inspection
- Country: Netherlands
- City: Almelo
What They Do
- Stress; Refractive Index; Reflectivity & Conductivity Measurement
- Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
- X-ray; XRF; 3-D X-Ray; LEXES Systems
Tags
Links
- Website: http://www.malvernpanalytical.com
Sources
2 sources · expo.semi.org, expo.semi.org
Partner Ecosystem
Companies with overlapping stages or tags.
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