Company Profile
KOH YOUNG TECHNOLOGY INC.
Semiconductor solutions in Defect; Particle; Bump; Contamination Detection, Review or Inspection and Die Inspection; Die Shear.
Defect; Particle; Bump; Contamination Detection, Review or Inspection 및 Die Inspection; Die Shear 분야의 반도체 솔루션을 제공합니다.
Trust Snapshot
Verification
Verified
Last verified: 2026-02-14
Quality Grade
Grade B
Sources: 2
Overview
- Primary stage: Test / Inspection
- Stages: Test / Inspection, Packaging / OSAT
- Country: Korea (South)
- City: 용인시
What They Do
- Defect; Particle; Bump; Contamination Detection, Review or Inspection
- Die Inspection; Die Shear
- Line Width; Critical Dimension (CD) Measurement
- Package Inspection; Lead Scanners
- Stress; Refractive Index; Reflectivity & Conductivity Measurement
- Wire Bonding Inspection; Test
Tags
Links
Sources
2 sources · expo.semi.org, expo.semi.org
Partner Ecosystem
Companies with overlapping stages or tags.
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