Company Profile

KOH YOUNG TECHNOLOGY INC.

Semiconductor solutions in Defect; Particle; Bump; Contamination Detection, Review or Inspection and Die Inspection; Die Shear.

Defect; Particle; Bump; Contamination Detection, Review or Inspection 및 Die Inspection; Die Shear 분야의 반도체 솔루션을 제공합니다.

Test / Inspection
Verified Quality B
Korea (South)
용인시

Trust Snapshot

Verification
Verified
Last verified: 2026-02-14
Quality Grade
Grade B
Sources: 2
Location
Korea (South)
용인시
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Overview

  • Primary stage: Test / Inspection
  • Stages: Test / Inspection, Packaging / OSAT
  • Country: Korea (South)
  • City: 용인시

What They Do

  • Defect; Particle; Bump; Contamination Detection, Review or Inspection
  • Die Inspection; Die Shear
  • Line Width; Critical Dimension (CD) Measurement
  • Package Inspection; Lead Scanners
  • Stress; Refractive Index; Reflectivity & Conductivity Measurement
  • Wire Bonding Inspection; Test

Tags

Links

Sources

2 sources · expo.semi.org, expo.semi.org

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