Company Profile

Frontier Semiconductor

Semiconductor solutions in Defect; Particle; Bump; Contamination Detection, Review or Inspection and Film Thickness; Thickness; Uniformity Measurement; Ellipsometer.

Defect; Particle; Bump; Contamination Detection, Review or Inspection 및 Film Thickness; Thickness; Uniformity Measurement; Ellipsometer 분야의 반도체 솔루션을 제공합니다.

Test / Inspection

Verified Quality B

United States

Milpitas

Trust Snapshot

Verification

Verified

Last verified: 2026-02-14

Quality Grade

Grade B

Sources: 2

Location

United States

Milpitas

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Overview

Primary stage: Test / Inspection
Stages: Test / Inspection, Equipment
Country: United States
City: Milpitas

What They Do

Defect; Particle; Bump; Contamination Detection, Review or Inspection
Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
Flat; Notch Finding System
Line Width; Critical Dimension (CD) Measurement
Microscopes: Atomic Force Microscopes (AFM)
Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes

Products / Tech

128/500/900 Warpage tool series

Sources

2 sources · expo.semi.org, expo.semi.org

Partner Ecosystem

Companies with overlapping stages or tags.

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