Company Profile

CRENVIS CO., LTD.

Semiconductor solutions in Defect; Particle; Bump; Contamination Detection, Review or Inspection and Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes.

Defect; Particle; Bump; Contamination Detection, Review or Inspection 및 Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes 분야의 반도체 솔루션을 제공합니다.

Test / Inspection

Verified Quality B

Korea (South)

Gwangju-si, Gyeonggi-do

Trust Snapshot

Verification

Verified

Last verified: 2026-02-14

Quality Grade

Grade B

Sources: 2

Location

Korea (South)

Gwangju-si, Gyeonggi-do

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Overview

Primary stage: Test / Inspection
Stages: Test / Inspection, Materials
Country: Korea (South)
City: Gwangju-si, Gyeonggi-do

What They Do

Defect; Particle; Bump; Contamination Detection, Review or Inspection
Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes
Particle Monitors; Analyzers - Airborne or Liquid
Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
Wafers
FPD Test; Measurement; Repair Equipment

Sources

2 sources · expo.semi.org, expo.semi.org

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