Company Profile
AUROS TECHNOLOGY, INC.
Semiconductor solutions in Film Thickness; Thickness; Uniformity Measurement; Ellipsometer and Overlay Measurement.
Film Thickness; Thickness; Uniformity Measurement; Ellipsometer 및 Overlay Measurement 분야의 반도체 솔루션을 제공합니다.
Trust Snapshot
Verification
Verified
Last verified: 2026-02-14
Quality Grade
Grade B
Sources: 2
Overview
- Primary stage: Materials
- Stages: Materials, Test / Inspection
- Country: Korea (South)
- City: Hwaseong-si
What They Do
- Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
- Overlay Measurement
- Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
Products / Tech
- OL-1000n
- HE-900ir
- WaPIS
- MT-30T
- AEliT-F300
Tags
Links
- Website: http://www.aurostech.com
Sources
2 sources · expo.semi.org, expo.semi.org
Partner Ecosystem
Companies with overlapping stages or tags.
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